Purchase your copy of ASTM E – 02() as a PDF download or hard copy directly from the official BSI Shop. All BSI British Standards. Find the most up-to-date version of ASTM E at Engineering ASTM E – E – 02 The test methods provide for reporting of specic, distinctive informati.

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satm The chart shows different area percentages of light grains among dark grains. Users of this standard are expressly advised that determination of the validity of any such patent rights, and the risk of infringement of such rights, are entirely their own responsibility.

The area occupied by the ne grains is what must be determined. On the overlay, also mark the outline of the total eld of view the limits of the image.

Etch specimens so that all grain boundaries are distinct and easily visible. Suppose that measurements indicate that the surface layers each average 3. The entire macroetched cross-section should be used as a basis for estimating area fractions occupied by distinct grain sizes, if possible. Any of the Intercept Procedures of E may aetm used, within the regions of distinct grain size.

The use of these is described asgm detail in Methods E If microscopic examination is subsequently necessary, individual specimens must be taken to allow estimation of area fractions for the entire product cross-section, and to allow determination of grain sizes representing the entire crosssection as well.

Referenced Documents purchase separately The documents listed below are referenced within the subject standard but are not provided as part of the standard.

The percent of the total intercept length represented by the intercept length in each class interval was then calculated by dividing each value in the seventh column by the total intercept length Use the lowest magnication that allows visual resolution of the coarse- and ne-grained areas as distinct regions. The area fraction occupied by the ne grain was calculated as the total intercept length e181 the ne grain region This value was then entered in the eighth column. Of these, the Comparison Procedure is the simplest, but offers the least precision.


ASTM E – 02 Standard Test Methods for Characterizing Duplex Grain Sizes

Practice E FIG. Use the “Duplex” button to start the programs designed to calculate duplex grain sizes. The area of each of those regions is then measured by tracing its outline with the planimeter. Estimate the area fraction for the grain size region being evaluated as the number of grid points falling within the region, divided by the e118 number of grid points that lie within the total image outline the grid must be large enough to completely cover the total image.

Duplex grain structures for example, multiphase alloys are not necessarily duplex in grain size, and as such are not the subject of these methods.

These items are briey described below, under the headings of the specic procedures to which they apply. For comparison of mechanical properties with metallurgical features, or for specication purposes, it may be important to be able to characterize grain size in such materials.

An example of such a plot is shown in Fig. A further example appears in Fig. Reduce that error by using graded area fraction comparison gures see Fig. One, the Direct Measurement Procedure see 8. Classication of the duplex grain size see 8. The Comparison Procedure is the simplest, but offers the least accuracy.

The grid spacing should be matched to the image magnication to fulll the recommendations of Practice E Examples of topological duplex grain sizes include: For all other products, area fraction estimates should be equally accurate with either specimen orientation.

Dividing that value by the magnication of the photomicrographgives an actual average intercept length of 0. All controls necessary for measurement are found on the easy to use control panel shown here. E — 02 The test methods provide for reporting of specic, distinctive information for each type of duplex grain size.

ASTM E1181 – 02(2015)

Further suppose that measurements indicate an average depth of that surface layer of 1. Examples of random duplex grain sizes include: Four procedures for estimating area fraction are described, the simplest to apply resulting in the least precision, and the most complicated resulting in the greatest precision. Examples of topological duplex grain sizes include: For example, averaging two distinctly different grain sizes may result in reporting a size that does not actually exist anywhere in the specimen.


Use of the grid is described in Methods E Such outlining will simplify decisions during point counting, and thus speed the counting process.

All e118 measurements are displayed in the “Current Field Results” box. If the specimen being examined is the full cross-section of a round bar, the longitudinal section should not be used to estimate the area fraction occupied by different grain sizes. An arbitrary division was made between the two distinct distributions of grain sizes. The grain size and area fraction values shown in that report format correspond to the appearance of the photomicrograph shown.

Begin by manually outlining all of the areas occupied by one of the distinct grain sizes in a given image, either on a transparent overlay placed over the projected image, or directly on the photomicrograph.

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Duplex grain structures for example, multiphase alloys are not necessarily duplex in grain size, and as such are not the subject of these asstm. A tube whose wall thickness is small compared to its outside diameter may be treated as equivalent to a product of rectangular cross-section, in that a surface e11181 of a given depth at 5 the outside diameter covers essentially the same area as a layer of the same depth at the inside diameter.

Assigning an average grain size value to a duplex grain size specimen does not adequately characterize the appearance of that specimen, and may even misrepresent its appearance.